한국표준정보망(KSSN)

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구판 판매

ISO/IEC 10373-6:2001/Amd 4:2006

Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure

- 발행일 : 2006-06-14
- 발행기관 : ISO/IEC

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상세정보

분야	ISO/IEC JTC 1/SC 17 : Cards and security devices for personal identification
적용범위
국제분류(ICS)코드	35.240.15 : 식별 카드 및 관련 장치
페이지수	11
Edition	1

이력정보

No.	표준번호	표준명	발행일	상태
1	ISO/IEC 10373-6:2020/Amd 1:2021	Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 1: Dynamic power level management	2021-05-17	구판
2	ISO/IEC 10373-6:2020/AMD1:2021	Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 1: Dynamic power level management	2021-05-17	폐지
3	CSA ISO/IEC 10373-6:21	Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects (Adopted ISO/IEC 10373-6:2020, fourth edition, 2020-07)	2021-01-01	표준
4	ISO/IEC 10373-6:2020/AMD2:2020	Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 2: Enhancements for harmonization	2020-11-27	표준
5	ISO/IEC 10373-6:2020/Amd 2:2020	Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 2: Enhancements for harmonization	2020-11-27	표준
6	ISO/IEC 10373-6:2020	Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects	2020-07-22	표준
7	ISO/IEC 10373-6:2020	Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects	2020-07-22	표준
8	ISO/IEC 10373-6:2016/AMD3:2018	Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: PICC loading effect	2018-03-27	구판
9	ISO/IEC 10373-6:2016/Amd 3:2018	Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: PICC loading effect	2018-03-27	구판
10	ISO/IEC 10373-6:2016	Identification cards — Test methods — Part 6: Proximity cards	2016-07-18	구판
11	ISO/IEC 10373-6:2016	Identification cards - Test methods - Part 6: Proximity cards	2016-07-18	구판
12	ISO/IEC 10373-6:2011/COR1:2013	Identification cards - Test methods - Part 6: Proximity cards - Technical Corrigendum 1: R2 value range, start of PICC transmission and program for EMD level measurement	2013-08-30	구판
13	ISO/IEC 10373-6:2011/Cor 1:2013	R2 value range, start of PICC transmission and program for EMD level measurement	2013-08-30	구판
14	ISO/IEC 10373-6:2011/AMD4:2012	Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes	2012-12-05	구판
15	ISO/IEC 10373-6:2011/Amd 4:2012	Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes	2012-12-05	구판
16	ISO/IEC 10373-6:2011/AMD2:2012	Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Test methods for electromagnetic disturbance	2012-10-09	구판
17	ISO/IEC 10373-6:2011/Amd 2:2012	Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Test methods for electromagnetic disturbance	2012-10-09	구판
18	ISO/IEC 10373-6:2011/AMD3:2012	Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2	2012-07-24	구판
19	ISO/IEC 10373-6:2011/Amd 3:2012	Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2	2012-07-24	구판
20	ISO/IEC 10373-6:2011/Amd 1:2012	Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Additional PICC classes	2012-04-19	구판
21	ISO/IEC 10373-6:2011/AMD1:2012	Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Additional PICC classes	2012-04-19	구판
22	ISO/IEC 10373-6:2011	Identification cards - Test methods - Part 6: Proximity cards	2011-01-07	구판
23	ISO/IEC 10373-6:2011	Identification cards — Test methods — Part 6: Proximity cards	2011-01-07	구판
24	ISO/IEC 10373-6:2001/Amd 7:2010	Identification cards — Test methods — Part 6: Proximity cards — Amendment 7: Test methods for ePassport	2010-03-10	구판
25	ISO/IEC 10373-6:2001/AMD7:2010	Identification cards - Test methods - Part 6: Proximity cards - Amendment 7: Test methods for ePassport	2010-03-10	구판
26	ISO/IEC 10373-6:2001/AMD5:2007	Identification cards - Test methods - Part 6: Proximity cards - Amendment 5: Bit rates of fc/64, fc/32 and fc/16	2007-10-11	구판
27	ISO/IEC 10373-6:2001/Amd 5:2007	Identification cards — Test methods — Part 6: Proximity cards — Amendment 5: Bit rates of fc/64, fc/32 and fc/16	2007-10-11	구판
28	ISO/IEC 10373-6:2001/Amd 1:2007	Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Protocol test methods for proximity cards	2007-03-30	구판
29	ISO/IEC 10373-6:2001/AMD1:2007	Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Protocol test methods for proximity cards	2007-03-30	구판
30	ISO/IEC 10373-6:2001/AMD3:2006	Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Protocol test methods for proximity coupling devices	2006-10-05	구판
31	ISO/IEC 10373-6:2001/Amd 3:2006	Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Protocol test methods for proximity coupling devices	2006-10-05	구판
32	ISO/IEC 10373-6:2001/Amd 4:2006	Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure	2006-06-14	구판
33	ISO/IEC 10373-6:2001/AMD4:2006	Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure	2006-06-14	구판
34	ISO/IEC 10373-6:2001/AMD2:2003	Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Improved RF test methods	2003-10-10	구판
35	ISO/IEC 10373-6:2001/Amd 2:2003	Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Improved RF test methods	2003-10-10	구판
36	ISO/IEC 10373-6:2001	Identification cards — Test methods — Part 6: Proximity cards	2001-05-31	구판
37	ISO/IEC 10373-6:2001	Identification cards - Test methods - Part 6: Proximity cards	2001-05-31	구판
38	ISO/IEC 10373-6:2001/DAmd 8.2	Additional PICC classes		초안

관련상품

ISO/IEC FDIS 10373-6 - Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects 상세보기

ISO/IEC 10373-6:2001/DAmd 8.2 - Additional PICC classes 상세보기

ISO/IEC 10373-8:2011 - Identification cards - Test methods - Part 8: USB-ICC 상세보기

ISO/IEC 10373-8:2011 - Identification cards — Test methods — Part 8: USB-ICC 상세보기

ISO/IEC 10373-9:2011 - Identification cards - Test methods - Part 9: Optical memory cards - Holographic recording method 상세보기
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해외표준

ISO/IEC 10373-6:2001/Amd 4:2006

상세정보

이력정보

관련상품

다른 사람이 함께 구입한 상품

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