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분야 | ISO/IEC JTC 1/SC 17 : Cards and security devices for personal identification |
---|---|
적용범위 | |
국제분류(ICS)코드 | 35.240.15 : 식별 카드 및 관련 장치 |
페이지수 | 67 |
Edition | 1.0 |
No. | 표준번호 | 표준명 | 발행일 | 상태 |
---|---|---|---|---|
1 | ISO/IEC 10373-6:2020/Amd 1:2021 | Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 1: Dynamic power level management | 2021-05-17 | 구판 |
2 | ISO/IEC 10373-6:2020/AMD1:2021 | Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 1: Dynamic power level management | 2021-05-17 | 폐지 |
3 | CSA ISO/IEC 10373-6:21 | Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects (Adopted ISO/IEC 10373-6:2020, fourth edition, 2020-07) | 2021-01-01 | 표준 |
4 | ISO/IEC 10373-6:2020/AMD2:2020 | Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 2: Enhancements for harmonization | 2020-11-27 | 표준 |
5 | ISO/IEC 10373-6:2020/Amd 2:2020 | Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 2: Enhancements for harmonization | 2020-11-27 | 표준 |
6 | ISO/IEC 10373-6:2020 | Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects | 2020-07-22 | 표준 |
7 | ISO/IEC 10373-6:2020 | Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects | 2020-07-22 | 표준 |
8 | ISO/IEC 10373-6:2016/AMD3:2018 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: PICC loading effect | 2018-03-27 | 구판 |
9 | ISO/IEC 10373-6:2016/Amd 3:2018 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: PICC loading effect | 2018-03-27 | 구판 |
10 | ISO/IEC 10373-6:2016 | Identification cards — Test methods — Part 6: Proximity cards | 2016-07-18 | 구판 |
11 | ISO/IEC 10373-6:2016 | Identification cards - Test methods - Part 6: Proximity cards | 2016-07-18 | 구판 |
12 | ISO/IEC 10373-6:2011/COR1:2013 | Identification cards - Test methods - Part 6: Proximity cards - Technical Corrigendum 1: R2 value range, start of PICC transmission and program for EMD level measurement | 2013-08-30 | 구판 |
13 | ISO/IEC 10373-6:2011/Cor 1:2013 | R2 value range, start of PICC transmission and program for EMD level measurement | 2013-08-30 | 구판 |
14 | ISO/IEC 10373-6:2011/AMD4:2012 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes | 2012-12-05 | 구판 |
15 | ISO/IEC 10373-6:2011/Amd 4:2012 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes | 2012-12-05 | 구판 |
16 | ISO/IEC 10373-6:2011/AMD2:2012 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Test methods for electromagnetic disturbance | 2012-10-09 | 구판 |
17 | ISO/IEC 10373-6:2011/Amd 2:2012 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Test methods for electromagnetic disturbance | 2012-10-09 | 구판 |
18 | ISO/IEC 10373-6:2011/AMD3:2012 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2 | 2012-07-24 | 구판 |
19 | ISO/IEC 10373-6:2011/Amd 3:2012 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2 | 2012-07-24 | 구판 |
20 | ISO/IEC 10373-6:2011/Amd 1:2012 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Additional PICC classes | 2012-04-19 | 구판 |
21 | ISO/IEC 10373-6:2011/AMD1:2012 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Additional PICC classes | 2012-04-19 | 구판 |
22 | ISO/IEC 10373-6:2011 | Identification cards - Test methods - Part 6: Proximity cards | 2011-01-07 | 구판 |
23 | ISO/IEC 10373-6:2011 | Identification cards — Test methods — Part 6: Proximity cards | 2011-01-07 | 구판 |
24 | ISO/IEC 10373-6:2001/Amd 7:2010 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 7: Test methods for ePassport | 2010-03-10 | 구판 |
25 | ISO/IEC 10373-6:2001/AMD7:2010 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 7: Test methods for ePassport | 2010-03-10 | 구판 |
26 | ISO/IEC 10373-6:2001/AMD5:2007 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 5: Bit rates of fc/64, fc/32 and fc/16 | 2007-10-11 | 구판 |
27 | ISO/IEC 10373-6:2001/Amd 5:2007 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 5: Bit rates of fc/64, fc/32 and fc/16 | 2007-10-11 | 구판 |
28 | ISO/IEC 10373-6:2001/Amd 1:2007 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Protocol test methods for proximity cards | 2007-03-30 | 구판 |
29 | ISO/IEC 10373-6:2001/AMD1:2007 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Protocol test methods for proximity cards | 2007-03-30 | 구판 |
30 | ISO/IEC 10373-6:2001/AMD3:2006 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Protocol test methods for proximity coupling devices | 2006-10-05 | 구판 |
31 | ISO/IEC 10373-6:2001/Amd 3:2006 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Protocol test methods for proximity coupling devices | 2006-10-05 | 구판 |
32 | ISO/IEC 10373-6:2001/Amd 4:2006 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure | 2006-06-14 | 구판 |
33 | ISO/IEC 10373-6:2001/AMD4:2006 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure | 2006-06-14 | 구판 |
34 | ISO/IEC 10373-6:2001/AMD2:2003 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Improved RF test methods | 2003-10-10 | 구판 |
35 | ISO/IEC 10373-6:2001/Amd 2:2003 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Improved RF test methods | 2003-10-10 | 구판 |
36 | ISO/IEC 10373-6:2001 | Identification cards — Test methods — Part 6: Proximity cards | 2001-05-31 | 구판 |
37 | ISO/IEC 10373-6:2001 | Identification cards - Test methods - Part 6: Proximity cards | 2001-05-31 | 구판 |
38 | ISO/IEC 10373-6:2001/DAmd 8.2 | Additional PICC classes | 초안 |
ISO/IEC FDIS 10373-6 - Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects 상세보기
ISO/IEC 10373-6:2001/DAmd 8.2 - Additional PICC classes 상세보기
ISO/IEC 10373-8:2011 - Identification cards - Test methods - Part 8: USB-ICC 상세보기
ISO/IEC 10373-8:2011 - Identification cards — Test methods — Part 8: USB-ICC 상세보기
ISO/IEC 10373-9:2011 - Identification cards - Test methods - Part 9: Optical memory cards - Holographic recording method 상세보기
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