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분야 | ISO/IEC JTC 1/SC 17 : Cards and security devices for personal identification |
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적용범위 | The ISO/IEC 10373 series defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross‑referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications. NOTE 1 Criteria for acceptability do not form part of the ISO/IEC 10373 series, but can be found in the International Standards mentioned above. This document defines test methods which are specific to proximity cards and objects, proximity coupling devices and proximity extended devices, defined in ISO/IEC 14443‑1, ISO/IEC 14443‑2, ISO/IEC 14443‑3 and ISO/IEC 14443‑4. NOTE 2 Test methods defined in this document are intended to be performed separately. A given proximity card or object, proximity coupling device or proximity extended device, is not required to pass through all the tests sequentially. ISO/IEC 10373‑1 defines test methods which are common to one or more integrated circuit card technologies and other parts in the ISO/IEC 10373 series deal with other technology‑specific tests. The conformance test plan defined in Annex O specifies the list of tests applicable for each part of the ISO/IEC 14443 series. |
국제분류(ICS)코드 | 35.240.15 : 식별 카드 및 관련 장치 |
페이지수 | 459 |
Edition | 4.0 |
No. | 표준번호 | 표준명 | 발행일 | 상태 |
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1 | ISO/IEC 10373-6:2020/Amd 1:2021 | Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 1: Dynamic power level management | 2021-05-17 | 구판 |
2 | ISO/IEC 10373-6:2020/AMD1:2021 | Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 1: Dynamic power level management | 2021-05-17 | 폐지 |
3 | CSA ISO/IEC 10373-6:21 | Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects (Adopted ISO/IEC 10373-6:2020, fourth edition, 2020-07) | 2021-01-01 | 표준 |
4 | ISO/IEC 10373-6:2020/AMD2:2020 | Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 2: Enhancements for harmonization | 2020-11-27 | 표준 |
5 | ISO/IEC 10373-6:2020/Amd 2:2020 | Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 2: Enhancements for harmonization | 2020-11-27 | 표준 |
6 | ISO/IEC 10373-6:2020 | Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects | 2020-07-22 | 표준 |
7 | ISO/IEC 10373-6:2020 | Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects | 2020-07-22 | 표준 |
8 | ISO/IEC 10373-6:2016/AMD3:2018 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: PICC loading effect | 2018-03-27 | 구판 |
9 | ISO/IEC 10373-6:2016/Amd 3:2018 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: PICC loading effect | 2018-03-27 | 구판 |
10 | ISO/IEC 10373-6:2016 | Identification cards — Test methods — Part 6: Proximity cards | 2016-07-18 | 구판 |
11 | ISO/IEC 10373-6:2016 | Identification cards - Test methods - Part 6: Proximity cards | 2016-07-18 | 구판 |
12 | ISO/IEC 10373-6:2011/COR1:2013 | Identification cards - Test methods - Part 6: Proximity cards - Technical Corrigendum 1: R2 value range, start of PICC transmission and program for EMD level measurement | 2013-08-30 | 구판 |
13 | ISO/IEC 10373-6:2011/Cor 1:2013 | R2 value range, start of PICC transmission and program for EMD level measurement | 2013-08-30 | 구판 |
14 | ISO/IEC 10373-6:2011/AMD4:2012 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes | 2012-12-05 | 구판 |
15 | ISO/IEC 10373-6:2011/Amd 4:2012 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes | 2012-12-05 | 구판 |
16 | ISO/IEC 10373-6:2011/AMD2:2012 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Test methods for electromagnetic disturbance | 2012-10-09 | 구판 |
17 | ISO/IEC 10373-6:2011/Amd 2:2012 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Test methods for electromagnetic disturbance | 2012-10-09 | 구판 |
18 | ISO/IEC 10373-6:2011/AMD3:2012 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2 | 2012-07-24 | 구판 |
19 | ISO/IEC 10373-6:2011/Amd 3:2012 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2 | 2012-07-24 | 구판 |
20 | ISO/IEC 10373-6:2011/Amd 1:2012 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Additional PICC classes | 2012-04-19 | 구판 |
21 | ISO/IEC 10373-6:2011/AMD1:2012 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Additional PICC classes | 2012-04-19 | 구판 |
22 | ISO/IEC 10373-6:2011 | Identification cards - Test methods - Part 6: Proximity cards | 2011-01-07 | 구판 |
23 | ISO/IEC 10373-6:2011 | Identification cards — Test methods — Part 6: Proximity cards | 2011-01-07 | 구판 |
24 | ISO/IEC 10373-6:2001/Amd 7:2010 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 7: Test methods for ePassport | 2010-03-10 | 구판 |
25 | ISO/IEC 10373-6:2001/AMD7:2010 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 7: Test methods for ePassport | 2010-03-10 | 구판 |
26 | ISO/IEC 10373-6:2001/AMD5:2007 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 5: Bit rates of fc/64, fc/32 and fc/16 | 2007-10-11 | 구판 |
27 | ISO/IEC 10373-6:2001/Amd 5:2007 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 5: Bit rates of fc/64, fc/32 and fc/16 | 2007-10-11 | 구판 |
28 | ISO/IEC 10373-6:2001/Amd 1:2007 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Protocol test methods for proximity cards | 2007-03-30 | 구판 |
29 | ISO/IEC 10373-6:2001/AMD1:2007 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Protocol test methods for proximity cards | 2007-03-30 | 구판 |
30 | ISO/IEC 10373-6:2001/AMD3:2006 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Protocol test methods for proximity coupling devices | 2006-10-05 | 구판 |
31 | ISO/IEC 10373-6:2001/Amd 3:2006 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Protocol test methods for proximity coupling devices | 2006-10-05 | 구판 |
32 | ISO/IEC 10373-6:2001/Amd 4:2006 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure | 2006-06-14 | 구판 |
33 | ISO/IEC 10373-6:2001/AMD4:2006 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure | 2006-06-14 | 구판 |
34 | ISO/IEC 10373-6:2001/AMD2:2003 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Improved RF test methods | 2003-10-10 | 구판 |
35 | ISO/IEC 10373-6:2001/Amd 2:2003 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Improved RF test methods | 2003-10-10 | 구판 |
36 | ISO/IEC 10373-6:2001 | Identification cards — Test methods — Part 6: Proximity cards | 2001-05-31 | 구판 |
37 | ISO/IEC 10373-6:2001 | Identification cards - Test methods - Part 6: Proximity cards | 2001-05-31 | 구판 |
38 | ISO/IEC 10373-6:2001/DAmd 8.2 | Additional PICC classes | 초안 |
ISO/IEC FDIS 10373-6 - Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects 상세보기
ISO/IEC 10373-6:2001/DAmd 8.2 - Additional PICC classes 상세보기
ISO/IEC 10373-8:2011 - Identification cards - Test methods - Part 8: USB-ICC 상세보기
ISO/IEC 10373-8:2011 - Identification cards — Test methods — Part 8: USB-ICC 상세보기
ISO/IEC 10373-9:2011 - Identification cards - Test methods - Part 9: Optical memory cards - Holographic recording method 상세보기
ISO/IEC 18092:2013 - Information technology — Telecommunications and information exchange between systems — Near Field Communication — Interface and Protocol (NFCIP-1) 상세보기
ISO/IEC 15693-3:2019 - Cards and security devices for personal identification — Contactless vicinity objects — Part 3: Anticollision and transmission protocol 상세보기
ISO/IEC 15693-2:2019 - Cards and security devices for personal identification — Contactless vicinity objects — Part 2: Air interface and initialization 상세보기
ISO/IEC 15693-1:2018 - Cards and security devices for personal identification — Contactless vicinity objects — Part 1: Physical characteristics 상세보기
ISO/IEC 18000-3:2010 - Information technology — Radio frequency identification for item management — Part 3: Parameters for air interface communications at 13,56 MHz 상세보기
IEC TS 63134:2020 - Active assisted living (AAL) use cases 상세보기
IEC 60034-5:2020 RLV - Rotating electrical machines - Part 5: Degrees of protection provided by the integral design of rotating electrical machines (IP code) - Classification 상세보기
KS B ISO TS 25740-1 - 에스컬레이터 및 무빙워크에 대한 안전요건 — 제1부: 세계공통 필수 안전요건(GESRs) 상세보기
KS B ISO TS 8100-21 - 승객 및 화물 운송용 엘리베이터 —제21부: 세계공통 필수안전요건(GESRs)을 충족하는 세계공통 안전 파라미터(GSPs) 상세보기
KS C IEC TS 62872 - 산업 시설과 스마트 그리드 사이의 산업 공정 측정, 제어 및 자동화 시스템 인터페이스 상세보기