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ISO/IEC FDIS 10373-6

Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects

- 발행일 :
- 발행기관 : ISO/IEC

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상세정보

분야	ISO/IEC JTC 1/SC 17 : Cards and security devices for personal identification
적용범위	The ISO/IEC 10373 series defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross‑referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications. NOTE 1 Criteria for acceptability do not form part of the ISO/IEC 10373 series, but can be found in the International Standards mentioned above. This document defines test methods which are specific to proximity cards and objects, proximity coupling devices and proximity extended devices, defined in ISO/IEC 14443‑1, ISO/IEC 14443‑2, ISO/IEC 14443‑3 and ISO/IEC 14443‑4. NOTE 2 Test methods defined in this document are intended to be performed separately. A given proximity card or object, proximity coupling device or proximity extended device, is not required to pass through all the tests sequentially. ISO/IEC 10373‑1 defines test methods which are common to one or more integrated circuit card technologies and other parts in the ISO/IEC 10373 series deal with other technology‑specific tests. The conformance test plan defined in Annex O specifies the list of tests applicable for each part of the ISO/IEC 14443 series.
국제분류(ICS)코드	35.240.15 : 식별 카드 및 관련 장치
페이지수	241
Edition	5

이력정보

No.	표준번호	표준명	발행일	상태
1	ISO/IEC 10373-6:2020/Amd 1:2021	Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 1: Dynamic power level management	2021-05-17	구판
2	ISO/IEC 10373-6:2020/AMD1:2021	Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 1: Dynamic power level management	2021-05-17	폐지
3	CSA ISO/IEC 10373-6:21	Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects (Adopted ISO/IEC 10373-6:2020, fourth edition, 2020-07)	2021-01-01	표준
4	ISO/IEC 10373-6:2020/AMD2:2020	Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 2: Enhancements for harmonization	2020-11-27	표준
5	ISO/IEC 10373-6:2020/Amd 2:2020	Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 2: Enhancements for harmonization	2020-11-27	표준
6	ISO/IEC 10373-6:2020	Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects	2020-07-22	표준
7	ISO/IEC 10373-6:2020	Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects	2020-07-22	표준
8	ISO/IEC 10373-6:2016/AMD3:2018	Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: PICC loading effect	2018-03-27	구판
9	ISO/IEC 10373-6:2016/Amd 3:2018	Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: PICC loading effect	2018-03-27	구판
10	ISO/IEC 10373-6:2016	Identification cards — Test methods — Part 6: Proximity cards	2016-07-18	구판
11	ISO/IEC 10373-6:2016	Identification cards - Test methods - Part 6: Proximity cards	2016-07-18	구판
12	ISO/IEC 10373-6:2011/COR1:2013	Identification cards - Test methods - Part 6: Proximity cards - Technical Corrigendum 1: R2 value range, start of PICC transmission and program for EMD level measurement	2013-08-30	구판
13	ISO/IEC 10373-6:2011/Cor 1:2013	R2 value range, start of PICC transmission and program for EMD level measurement	2013-08-30	구판
14	ISO/IEC 10373-6:2011/AMD4:2012	Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes	2012-12-05	구판
15	ISO/IEC 10373-6:2011/Amd 4:2012	Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes	2012-12-05	구판
16	ISO/IEC 10373-6:2011/AMD2:2012	Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Test methods for electromagnetic disturbance	2012-10-09	구판
17	ISO/IEC 10373-6:2011/Amd 2:2012	Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Test methods for electromagnetic disturbance	2012-10-09	구판
18	ISO/IEC 10373-6:2011/AMD3:2012	Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2	2012-07-24	구판
19	ISO/IEC 10373-6:2011/Amd 3:2012	Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2	2012-07-24	구판
20	ISO/IEC 10373-6:2011/Amd 1:2012	Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Additional PICC classes	2012-04-19	구판
21	ISO/IEC 10373-6:2011/AMD1:2012	Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Additional PICC classes	2012-04-19	구판
22	ISO/IEC 10373-6:2011	Identification cards - Test methods - Part 6: Proximity cards	2011-01-07	구판
23	ISO/IEC 10373-6:2011	Identification cards — Test methods — Part 6: Proximity cards	2011-01-07	구판
24	ISO/IEC 10373-6:2001/Amd 7:2010	Identification cards — Test methods — Part 6: Proximity cards — Amendment 7: Test methods for ePassport	2010-03-10	구판
25	ISO/IEC 10373-6:2001/AMD7:2010	Identification cards - Test methods - Part 6: Proximity cards - Amendment 7: Test methods for ePassport	2010-03-10	구판
26	ISO/IEC 10373-6:2001/AMD5:2007	Identification cards - Test methods - Part 6: Proximity cards - Amendment 5: Bit rates of fc/64, fc/32 and fc/16	2007-10-11	구판
27	ISO/IEC 10373-6:2001/Amd 5:2007	Identification cards — Test methods — Part 6: Proximity cards — Amendment 5: Bit rates of fc/64, fc/32 and fc/16	2007-10-11	구판
28	ISO/IEC 10373-6:2001/Amd 1:2007	Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Protocol test methods for proximity cards	2007-03-30	구판
29	ISO/IEC 10373-6:2001/AMD1:2007	Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Protocol test methods for proximity cards	2007-03-30	구판
30	ISO/IEC 10373-6:2001/AMD3:2006	Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Protocol test methods for proximity coupling devices	2006-10-05	구판
31	ISO/IEC 10373-6:2001/Amd 3:2006	Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Protocol test methods for proximity coupling devices	2006-10-05	구판
32	ISO/IEC 10373-6:2001/Amd 4:2006	Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure	2006-06-14	구판
33	ISO/IEC 10373-6:2001/AMD4:2006	Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure	2006-06-14	구판
34	ISO/IEC 10373-6:2001/AMD2:2003	Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Improved RF test methods	2003-10-10	구판
35	ISO/IEC 10373-6:2001/Amd 2:2003	Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Improved RF test methods	2003-10-10	구판
36	ISO/IEC 10373-6:2001	Identification cards — Test methods — Part 6: Proximity cards	2001-05-31	구판
37	ISO/IEC 10373-6:2001	Identification cards - Test methods - Part 6: Proximity cards	2001-05-31	구판
38	ISO/IEC 10373-6:2001/DAmd 8.2	Additional PICC classes		초안

관련상품

ISO/IEC 10373-6:2001/DAmd 8.2 - Additional PICC classes 상세보기

ISO/IEC 10373-8:2011 - Identification cards - Test methods - Part 8: USB-ICC 상세보기

ISO/IEC 10373-8:2011 - Identification cards — Test methods — Part 8: USB-ICC 상세보기

ISO/IEC 10373-9:2011 - Identification cards - Test methods - Part 9: Optical memory cards - Holographic recording method 상세보기

ISO/IEC 10373-9:2011 - Identification cards — Test methods — Part 9: Optical memory cards — Holographic recording method 상세보기
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해외표준

ISO/IEC FDIS 10373-6

상세정보

이력정보

관련상품

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