관심표준 등록 : 표준업데이트 시 알림을 받을 수 있습니다.
PDF : 직접 파일 다운로드 및 인쇄 (마이페이지 확인)
PRINT : 인쇄본 우편발송, 2~3일 소요(PDF파일 미제공)
분야 | ISO/IEC JTC 1/SC 17 : Cards and security devices for personal identification |
---|---|
적용범위 | |
국제분류(ICS)코드 | 35.240.15 : 식별 카드 및 관련 장치 |
페이지수 | 24 |
Edition | 1 |
No. | 표준번호 | 표준명 | 발행일 | 상태 |
---|---|---|---|---|
1 | ISO/IEC 10373-6:2020/Amd 1:2021 | Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 1: Dynamic power level management | 2021-05-17 | 구판 |
2 | ISO/IEC 10373-6:2020/AMD1:2021 | Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 1: Dynamic power level management | 2021-05-17 | 폐지 |
3 | CSA ISO/IEC 10373-6:21 | Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects (Adopted ISO/IEC 10373-6:2020, fourth edition, 2020-07) | 2021-01-01 | 표준 |
4 | ISO/IEC 10373-6:2020/AMD2:2020 | Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 2: Enhancements for harmonization | 2020-11-27 | 표준 |
5 | ISO/IEC 10373-6:2020/Amd 2:2020 | Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 2: Enhancements for harmonization | 2020-11-27 | 표준 |
6 | ISO/IEC 10373-6:2020 | Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects | 2020-07-22 | 표준 |
7 | ISO/IEC 10373-6:2020 | Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects | 2020-07-22 | 표준 |
8 | ISO/IEC 10373-6:2016/AMD3:2018 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: PICC loading effect | 2018-03-27 | 구판 |
9 | ISO/IEC 10373-6:2016/Amd 3:2018 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: PICC loading effect | 2018-03-27 | 구판 |
10 | ISO/IEC 10373-6:2016 | Identification cards — Test methods — Part 6: Proximity cards | 2016-07-18 | 구판 |
11 | ISO/IEC 10373-6:2016 | Identification cards - Test methods - Part 6: Proximity cards | 2016-07-18 | 구판 |
12 | ISO/IEC 10373-6:2011/COR1:2013 | Identification cards - Test methods - Part 6: Proximity cards - Technical Corrigendum 1: R2 value range, start of PICC transmission and program for EMD level measurement | 2013-08-30 | 구판 |
13 | ISO/IEC 10373-6:2011/Cor 1:2013 | R2 value range, start of PICC transmission and program for EMD level measurement | 2013-08-30 | 구판 |
14 | ISO/IEC 10373-6:2011/AMD4:2012 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes | 2012-12-05 | 구판 |
15 | ISO/IEC 10373-6:2011/Amd 4:2012 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes | 2012-12-05 | 구판 |
16 | ISO/IEC 10373-6:2011/AMD2:2012 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Test methods for electromagnetic disturbance | 2012-10-09 | 구판 |
17 | ISO/IEC 10373-6:2011/Amd 2:2012 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Test methods for electromagnetic disturbance | 2012-10-09 | 구판 |
18 | ISO/IEC 10373-6:2011/AMD3:2012 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2 | 2012-07-24 | 구판 |
19 | ISO/IEC 10373-6:2011/Amd 3:2012 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2 | 2012-07-24 | 구판 |
20 | ISO/IEC 10373-6:2011/Amd 1:2012 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Additional PICC classes | 2012-04-19 | 구판 |
21 | ISO/IEC 10373-6:2011/AMD1:2012 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Additional PICC classes | 2012-04-19 | 구판 |
22 | ISO/IEC 10373-6:2011 | Identification cards - Test methods - Part 6: Proximity cards | 2011-01-07 | 구판 |
23 | ISO/IEC 10373-6:2011 | Identification cards — Test methods — Part 6: Proximity cards | 2011-01-07 | 구판 |
24 | ISO/IEC 10373-6:2001/Amd 7:2010 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 7: Test methods for ePassport | 2010-03-10 | 구판 |
25 | ISO/IEC 10373-6:2001/AMD7:2010 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 7: Test methods for ePassport | 2010-03-10 | 구판 |
26 | ISO/IEC 10373-6:2001/AMD5:2007 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 5: Bit rates of fc/64, fc/32 and fc/16 | 2007-10-11 | 구판 |
27 | ISO/IEC 10373-6:2001/Amd 5:2007 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 5: Bit rates of fc/64, fc/32 and fc/16 | 2007-10-11 | 구판 |
28 | ISO/IEC 10373-6:2001/Amd 1:2007 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Protocol test methods for proximity cards | 2007-03-30 | 구판 |
29 | ISO/IEC 10373-6:2001/AMD1:2007 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Protocol test methods for proximity cards | 2007-03-30 | 구판 |
30 | ISO/IEC 10373-6:2001/AMD3:2006 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Protocol test methods for proximity coupling devices | 2006-10-05 | 구판 |
31 | ISO/IEC 10373-6:2001/Amd 3:2006 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Protocol test methods for proximity coupling devices | 2006-10-05 | 구판 |
32 | ISO/IEC 10373-6:2001/Amd 4:2006 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure | 2006-06-14 | 구판 |
33 | ISO/IEC 10373-6:2001/AMD4:2006 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure | 2006-06-14 | 구판 |
34 | ISO/IEC 10373-6:2001/AMD2:2003 | Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Improved RF test methods | 2003-10-10 | 구판 |
35 | ISO/IEC 10373-6:2001/Amd 2:2003 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Improved RF test methods | 2003-10-10 | 구판 |
36 | ISO/IEC 10373-6:2001 | Identification cards — Test methods — Part 6: Proximity cards | 2001-05-31 | 구판 |
37 | ISO/IEC 10373-6:2001 | Identification cards - Test methods - Part 6: Proximity cards | 2001-05-31 | 구판 |
38 | ISO/IEC 10373-6:2001/DAmd 8.2 | Additional PICC classes | 초안 |
ISO/IEC FDIS 10373-6 - Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects 상세보기
ISO/IEC 10373-6:2001/DAmd 8.2 - Additional PICC classes 상세보기
ISO/IEC 10373-8:2011 - Identification cards - Test methods - Part 8: USB-ICC 상세보기
ISO/IEC 10373-8:2011 - Identification cards — Test methods — Part 8: USB-ICC 상세보기
ISO/IEC 10373-9:2011 - Identification cards - Test methods - Part 9: Optical memory cards - Holographic recording method 상세보기
함께 구입한 상품이 존재하지 않습니다.
IEC TS 63134:2020 - Active assisted living (AAL) use cases 상세보기
IEC 60034-5:2020 RLV - Rotating electrical machines - Part 5: Degrees of protection provided by the integral design of rotating electrical machines (IP code) - Classification 상세보기
KS B ISO TS 25740-1 - 에스컬레이터 및 무빙워크에 대한 안전요건 — 제1부: 세계공통 필수 안전요건(GESRs) 상세보기
KS B ISO TS 8100-21 - 승객 및 화물 운송용 엘리베이터 —제21부: 세계공통 필수안전요건(GESRs)을 충족하는 세계공통 안전 파라미터(GSPs) 상세보기
KS C IEC TS 62872 - 산업 시설과 스마트 그리드 사이의 산업 공정 측정, 제어 및 자동화 시스템 인터페이스 상세보기