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Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
| 분야 | TC 47 : Semiconductor devices |
|---|---|
| 적용범위 | Provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes in electrical and/or physical characteristics can result from these mechanical stresses. Applies to single, dual and triple chamber temperature cycling and covers component and solder interconnection testing. |
| 국제분류(ICS)코드 | 31.080.01 : 반도체 장치 일반 |
| 페이지수 | 25 |
| Edition | 1.0 |
| No. | 표준번호 | 표준명 | 발행일 | 상태 |
|---|---|---|---|---|
| 1 | IEC 60749-25:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling | 2003-07-11 | 표준 |
IEC 60749-2:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure 상세보기
IEC 60749-11:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method 상세보기
IEC 60749-1:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General 상세보기
IEC 60749-8:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing 상세보기
IEC 60749-31:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced) 상세보기
IEC 60749-6:2017 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature 상세보기
IEC 60749-5:2023 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test 상세보기
IEC 60749-34:2010 - Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling 상세보기
IEC 60068-2-27:2008 - Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock 상세보기
IEC 60068-2-6:2007 - Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) 상세보기
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