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Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
| 분야 | TC 47/SC 47E : Discrete semiconductor devices |
|---|---|
| 적용범위 | IEC 60747-4:2007+A1:2017 Provides requirements for the following categories of discrete devices: variable capacitance diodes and snap-off diodes, mixer diodes and detector diodes, avalanche diodes, gunn diodes,bipolar transistors and field-effect transistors. This second edition cancels and replaces the first edition, published in 1991, its amendments 1, 2 and 3 (1993, 1999 and 2001, respectively), and constitutes a technical revision. This consolidated version consists of the second edition (2007) and its amendment 1 (2017). Therefore, no need to order amendment in addition to this publication. |
| 국제분류(ICS)코드 |
31.080.10 : 다이오우드
31.080.30 : 트랜지스터 |
| 페이지수 | 548 |
| Edition | 2.1 |
| No. | 표준번호 | 표준명 | 발행일 | 상태 |
|---|---|---|---|---|
| 1 | IEC 60747-4:2007/AMD1:2017 | Amendment 1 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors | 2017-01-30 | 표준 |
| 2 | IEC 60747-4:2007+AMD1:2017 CSV | Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors | 2017-01-30 | 표준 |
| 3 | IEC 60747-4:2007 | Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors | 2007-08-23 | 표준 |
| 4 | IEC 60747-4:1991+AMD1:1993+AMD2:1999 CSV | Semiconductor devices - Discrete devices - Part 4: Microwave devices | 2001-09-26 | 구판 |
| 5 | IEC 60747-4:1991/AMD2:1999 | Amendment 2 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors | 1999-04-16 | 구판 |
| 6 | IEC 60747-4:1991/AMD1:1993 | Amendment 1 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors | 1993-10-08 | 구판 |
| 7 | IEC 60747-4:1991 | Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors | 1991-05-08 | 구판 |
IEC 60747-11:1985 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices 상세보기
IEC 60747-3-1:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section One: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes 상세보기
IEC 60747-3-2:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section Two: Blank detail specification for voltage-regulator diodes and voltage-reference diodes,excluding temperature-compensated precision reference diodes 상세보기
IEC 60747-8-1:1987 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section One: Blank detail specification for single-gate field-effect transistors up to 5 W and 1 GHz 상세보기
IEC 60747-7-1:1989 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors - Section One: Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification 상세보기
IEC 60749-30:2020 RLV - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing 상세보기
IEC 60747-5-5:2020 - Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers 상세보기
IEC 60068-3-7:2020 - Environmental testing - Part 3-7: Supporting documentation and guidance - Measurements in temperature chambers for tests A (Cold) and B (Dry heat) (with load) 상세보기
IEC TS 63134:2020 - Active assisted living (AAL) use cases 상세보기
IEC 60034-5:2020 RLV - Rotating electrical machines - Part 5: Degrees of protection provided by the integral design of rotating electrical machines (IP code) - Classification 상세보기
KS B ISO TS 25740-1 - 에스컬레이터 및 무빙워크에 대한 안전요건 — 제1부: 세계공통 필수 안전요건(GESRs) 상세보기
KS B ISO TS 8100-21 - 승객 및 화물 운송용 엘리베이터 —제21부: 세계공통 필수안전요건(GESRs)을 충족하는 세계공통 안전 파라미터(GSPs) 상세보기
KS C IEC TS 62872 - 산업 시설과 스마트 그리드 사이의 산업 공정 측정, 제어 및 자동화 시스템 인터페이스 상세보기
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