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Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
| 분야 | TC 47/SC 47E : Discrete semiconductor devices |
|---|---|
| 적용범위 | IEC 60747-5-5:2020 specifies the terminology, essential ratings, characteristics, safety tests, as well as the measuring methods for photocouplers. Note: The term "optocoupler" can also be used instead of "photocoupler". This edition includes the following significant technical changes with respect to the previous edition: a) optional data sheet basic insulation rating in accordance with IEC 60664-1:2007, 6.1.3.5; b) editorial corrections on the use of VIORM; c) editorial corrections on Figure 2: Time intervals for method b); d) addition of an alternative surge pulse VIOSM test method. |
| 국제분류(ICS)코드 |
31.260 : 광전자공학. 레이저 장비
31.080.01 : 반도체 장치 일반 |
| 페이지수 | 52 |
| Edition | 2.0 |
| No. | 표준번호 | 표준명 | 발행일 | 상태 |
|---|---|---|---|---|
| 1 | IEC 60747-5-5:2020 | Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers | 2020-07-20 | 표준 |
| 2 | IEC 60747-5-5:2007+AMD1:2013 CSV | Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers | 2013-05-13 | 구판 |
| 3 | IEC 60747-5-5:2007/AMD1:2013 | Amendment 1 - Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers | 2013-05-13 | 구판 |
| 4 | IEC 60747-5-5:2007 | Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers | 2007-09-26 | 구판 |
IEC 60747-11:1985 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices 상세보기
IEC 60747-3-1:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section One: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes 상세보기
IEC 60747-3-2:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section Two: Blank detail specification for voltage-regulator diodes and voltage-reference diodes,excluding temperature-compensated precision reference diodes 상세보기
IEC 60747-8-1:1987 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section One: Blank detail specification for single-gate field-effect transistors up to 5 W and 1 GHz 상세보기
IEC 60747-7-1:1989 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors - Section One: Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification 상세보기
IEC 60749-30:2020 RLV - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing 상세보기
IEC 60068-3-7:2020 - Environmental testing - Part 3-7: Supporting documentation and guidance - Measurements in temperature chambers for tests A (Cold) and B (Dry heat) (with load) 상세보기
IEC 60747-4:2007+AMD1:2017 CSV - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors 상세보기
IEC TS 63134:2020 - Active assisted living (AAL) use cases 상세보기
IEC 60034-5:2020 RLV - Rotating electrical machines - Part 5: Degrees of protection provided by the integral design of rotating electrical machines (IP code) - Classification 상세보기
KS B ISO TS 25740-1 - 에스컬레이터 및 무빙워크에 대한 안전요건 — 제1부: 세계공통 필수 안전요건(GESRs) 상세보기
KS B ISO TS 8100-21 - 승객 및 화물 운송용 엘리베이터 —제21부: 세계공통 필수안전요건(GESRs)을 충족하는 세계공통 안전 파라미터(GSPs) 상세보기
KS C IEC TS 62872 - 산업 시설과 스마트 그리드 사이의 산업 공정 측정, 제어 및 자동화 시스템 인터페이스 상세보기
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