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Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
| 분야 | TC 47/SC 47E : Discrete semiconductor devices |
|---|---|
| 적용범위 | IEC 60747-5-5:2007+A1:2013 gives the terminology, essential ratings, characteristics, safety test as well as the measuring method for photocouplers (or optocouplers). NOTE The word "optocoupler" can also be used instead of "photocoupler". This standard replaces the clauses for photocouplers (or optocouplers) described in IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3, including their amendments. The contents for phototransistors and photothyristors in IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3, including their amendments, will be considered obsolete as of the effective date of publication of this standard. NOTE Photocouplers that are certified to the previous version of the photocoupler standard, namely IEC 60747-5-1/2/3, are to be considered in compliance with the requirements and provisions of IEC 60747-5-5. This consolidated version consists of the first edition (2007) and its amendment 1 (2013). Therefore, no need to order amendment in addition to this publication. |
| 국제분류(ICS)코드 |
31.260 : 광전자공학. 레이저 장비
31.080.01 : 반도체 장치 일반 |
| 페이지수 | 104 |
| Edition | 1.1 |
| No. | 표준번호 | 표준명 | 발행일 | 상태 |
|---|---|---|---|---|
| 1 | IEC 60747-5-5:2020 | Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers | 2020-07-20 | 표준 |
| 2 | IEC 60747-5-5:2007+AMD1:2013 CSV | Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers | 2013-05-13 | 구판 |
| 3 | IEC 60747-5-5:2007/AMD1:2013 | Amendment 1 - Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers | 2013-05-13 | 구판 |
| 4 | IEC 60747-5-5:2007 | Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers | 2007-09-26 | 구판 |
IEC 60747-11:1985 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices 상세보기
IEC 60747-3-1:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section One: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes 상세보기
IEC 60747-3-2:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section Two: Blank detail specification for voltage-regulator diodes and voltage-reference diodes,excluding temperature-compensated precision reference diodes 상세보기
IEC 60747-8-1:1987 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section One: Blank detail specification for single-gate field-effect transistors up to 5 W and 1 GHz 상세보기
IEC 60747-7-1:1989 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors - Section One: Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification 상세보기
MIL-STD-810 Revision E:1989 - ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS 상세보기
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MIL-STD-810 Revision H:2019 - ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS 상세보기
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