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분야 | |
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적용범위 | 1.1?This test method covers the quantitative measurement of thermal effusivity of woven, knitted, or non-woven fabrics using a guarded modified transient plane source (MTPS) instrument.4 This test method is applicable to a wide range of thicknesses; however, the thickness of the specimen must be greater than the penetration depth of the heat flux during the measurement time. 1.2?This test method is comparative since specimens of known thermal effusivity are used to calibrate the apparatus at the factory level. Thermal effusivity of the calibration specimens are confirmed through calculations that use established properties of thermal conductivity, density, and specific heat. 1.3?This test method is intended for measuring fabrics in a dry state at ambient conditions. 1.4?The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.5?This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.6?This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. |
국제분류(ICS)코드 | |
페이지수 | 5 |
Edition | 21 |
No. | 표준번호 | 표준명 | 발행일 | 상태 |
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1 | ASTM D7984-21 | Standard Test Method for Measurement of Thermal Effusivity of Fabrics Using a Modified Transient Plane Source (MTPS) Instrument | 2021-07-01 | 표준 |
2 | ASTM D7984-21 REDLINE | Standard Test Method for Measurement of Thermal Effusivity of Fabrics Using a Modified Transient Plane Source (MTPS) Instrument | 2021-07-01 | 표준 |
3 | ASTM D7984-16 | Standard Test Method for Measurement of Thermal Effusivity of Fabrics Using a Modified Transient Plane Source (MTPS) Instrument | 2016-02-15 | 구판 |
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