관심표준 등록 : 표준업데이트 시 알림을 받을 수 있습니다.
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분야 | 03.01 : 금속-기계적 시험;가열 및 저온시험;금속 조직학 |
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적용범위 | 1.1 These test methods are used to determine grain size from measurements of grain intercept lengths, intercept counts, intersection counts, grain boundary length, and grain areas. 1.2 These measurements are made with a semiautomatic digitizing tablet or by automatic image analysis using an image of the grain structure produced by a microscope. 1.3 These test methods are applicable to any type of grain structure or grain size distribution as long as the grain boundaries can be clearly delineated by etching and subsequent image processing, if necessary. 1.4 These test methods are applicable to measurement of other grain-like microstructures, such as cell structures. 1.5 This standard deals only with the recommended test methods and nothing in it should be construed as defining or establishing limits of acceptability or fitness for purpose of the materials tested. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. 1.6 The sections appear in the following order: |
국제분류(ICS)코드 | |
페이지수 | 22 |
Edition | 97(2004) |
No. | 표준번호 | 표준명 | 발행일 | 상태 |
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1 | ASTM E1382-97(2023) | Standard Test Methods for Determining Average Grain Size Using Semiautomatic and Automatic Image Analysis | 2023-04-01 | 표준 |
2 | ASTM E1382-97(2015) | Standard Test Methods for Determining Average Grain Size Using Semiautomatic and Automatic Image Analysis | 2015-10-01 | 구판 |
3 | ASTM E1382-97(2010) | Standard Test Methods for Determining Average Grain Size Using Semiautomatic and Automatic Image Analysis | 2010-11-01 | 구판 |
4 | ASTM E1382-97(2004) | Standard Test Methods for Determining Average Grain Size Using Semiautomatic and Automatic Image Analysis | 2004-11-01 | 구판 |
5 | ASTM E1382-97 | Standard Test Methods for Determining Average Grain Size Using Semiautomatic and Automatic Image Analysis | 1997-04-10 | 구판 |
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