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표준 판매

IEC 60747-5-4:2022

Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

- 발행일 : 2022-04-27
- 발행기관 : IEC

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분야	TC 47/SC 47E : Discrete semiconductor devices
적용범위	IEC 60747-5-4:2022(E) specifies the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers. This edition includes the following significant technical changes with respect to the previous edition: References for the terms and definitions related to the lighting area, IEC 60050-845, are revised based on IEC 60050-845:2020; Emission angle is changed to radiation angle in 3.3.2; Definitions of rise time and fall time in 3.4.1 are revised based on the publication IEC 60050-521:2002; Spectral linewidth is added to Table 1 in Clause 4; Conditions for carrier-to-noise ratio of Table 1 in Clause 4 is amended. Error in the equation for carrier-to-noise ratio in 5.2.2 is corrected; Precaution against the equipment used for carrier-to-noise ratio measurement is added in 5.2.2; Explanation for the measurement method of the small signal cut-off frequency in 5.3.2 of the first edition is deleted because it has been defined in the latest version of ISO 11554; Reference document for the lifetime in 5.4 is amended; Precaution against the measuring arrangement used for the half-intensity width and 1/e2-intensity is added in 5.5.3; Reference tables in Annex A, Annex B and Annex C are revised by following the latest version of ISO publications.
국제분류(ICS)코드	31.260 : 광전자공학. 레이저 장비 31.080.01 : 반도체 장치 일반
페이지수	33
Edition	2.0

이력정보

No.	표준번호	표준명	발행일	상태
1	IEC 60747-5-4:2022	Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers	2022-04-27	표준
2	IEC 60747-5-4:2006	Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers	2006-02-23	구판

관련상품

IEC 60747-11:1985 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices 상세보기

IEC 60747-3-1:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section One: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes 상세보기

IEC 60747-3-2:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section Two: Blank detail specification for voltage-regulator diodes and voltage-reference diodes,excluding temperature-compensated precision reference diodes 상세보기

IEC 60747-8-1:1987 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section One: Blank detail specification for single-gate field-effect transistors up to 5 W and 1 GHz 상세보기

IEC 60747-7-1:1989 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors - Section One: Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification 상세보기
다른 사람이 함께 구입한 상품

IEC 60747-5-5:2020 - Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers 상세보기

IEC 60747-5-6:2021 - Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes 상세보기

IEC 60747-5-7:2016 - Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors 상세보기

IEC 60747-5-2:1997+AMD1:2002 CSV - Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics 상세보기
추천 상품

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KS B ISO TS 25740-1 - 에스컬레이터 및 무빙워크에 대한 안전요건 — 제1부: 세계공통 필수 안전요건(GESRs) 상세보기

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KS C IEC TS 62872 - 산업 시설과 스마트 그리드 사이의 산업 공정 측정, 제어 및 자동화 시스템 인터페이스 상세보기

해외표준

IEC 60747-5-4:2022

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