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High-voltage switchgear and controlgear - Part 101: Synthetic testing
| 분야 | TC 17/SC 17A : Switching devices |
|---|---|
| 적용범위 | IEC 62271-101:2012 mainly applies to a.c. circuit-breakers within the scope of IEC 62271-100. It provides the general rules for testing a.c. circuit-breakers, for making and breaking capacities over the range of test duties described in 6.102 to 6.111 of IEC 62271-100:2008, by synthetic methods. This second edition cancels and replaces the first edition published in 2007 and its Amendment 1 published in 2011. It constitutes a technical revision. This edition includes the following significant technical changes with respect to the first edition: - addition of the new rated voltages of 1 100 kV and 1 200 kV; - revision of Annex F regarding circuit-breakers with opening resistors; - alignment with the second edition of IEC 62271-100:2008 and its Amendment 1 (2012). This publication is to be read in conjunction with IEC 62271-100:2008. |
| 국제분류(ICS)코드 | 29.130.10 : 고전압 스위치 기어 및 콘트롤 기어 |
| 페이지수 | 332 |
| Edition | 2.0 |
| No. | 표준번호 | 표준명 | 발행일 | 상태 |
|---|---|---|---|---|
| 1 | IEC 62271-101:2021/COR1:2021 | Corrigendum 1 - High-voltage switchgear and controlgear - Part 101: Synthetic testing | 2021-10-22 | 표준 |
| 2 | IEC 62271-101:2021 | High-voltage switchgear and controlgear - Part 101: Synthetic testing | 2021-07-27 | 표준 |
| 3 | IEC 62271-101:2012/AMD1:2017/COR1:2018 | Corrigendum 1 - Amendment 1 - High-voltage switchgear and controlgear - Part 101: Synthetic testing | 2018-01-24 | 구판 |
| 4 | IEC 62271-101:2012/AMD1:2017 | Amendment 1 - High-voltage switchgear and controlgear - Part 101: Synthetic testing | 2017-11-30 | 구판 |
| 5 | IEC 62271-101:2012+AMD1:2017 CSV | High-voltage switchgear and controlgear - Part 101: Synthetic testing | 2017-11-30 | 구판 |
| 6 | IEC 62271-101:2012 | High-voltage switchgear and controlgear - Part 101: Synthetic testing | 2012-10-12 | 구판 |
| 7 | IEC 62271-101:2006+AMD1:2010 CSV | High-voltage switchgear and controlgear - Part 101: Synthetic testing | 2010-11-29 | 구판 |
| 8 | IEC 62271-101:2006/AMD1:2010 | Amendment 1 - High-voltage switchgear and controlgear - Part 101: Synthetic testing | 2010-05-11 | 구판 |
| 9 | IEC 62271-101:2006 | High-voltage switchgear and controlgear - Part 101: Synthetic testing | 2006-05-23 | 구판 |
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