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Reliability growth - Statistical test and estimation methods
| 분야 | TC 56 : Dependability |
|---|---|
| 적용범위 | IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are: - addition of two statistical models for reliability growth planning and tracking in the product design phase; - statistical methods for the reliability growth programme in the design phase of IEC 61014; - addition of the discrete reliability growth model for the test phase; - addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models; - addition of real lif examples for most of the statistical models; - numerical correction of tables in the reliability growth test example. This publication is to be read in conjunction with IEC 61014:2003. |
| 국제분류(ICS)코드 |
03.120.01 : 일반 품질
03.120.30 : 통계적 방법의 응용 |
| 페이지수 | 111 |
| Edition | 2.0 |
| No. | 표준번호 | 표준명 | 발행일 | 상태 |
|---|---|---|---|---|
| 1 | IEC 61164:2004 | Reliability growth - Statistical test and estimation methods | 2004-03-24 | 표준 |
| 2 | IEC 61164:1995 | Reliability growth - Statistical test and estimation methods | 1995-06-27 | 구판 |
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