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Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤16 A per phase and not subject to conditional connection
| 분야 | TC 77/SC 77A : EMC - Low frequency phenomena |
|---|---|
| 적용범위 | IEC 61000-3-3:2008 is concerned with the limitation of voltage fluctuations and flicker impressed on the public low-voltage system. It specifies limits of voltage changes which may be produced by an equipment tested under specified conditions and gives guidance on methods of assessment. This part of IEC 61000 is applicable to electrical and electronic equipment having an input current equal to or less than 16 A per phase, intended to be connected to public low-voltage distribution systems of between 220 V and 250 V line to neutral at 50 Hz, and not subject to conditional connection. The tests according to this part are type tests. Particular test conditions are given in annex A and the test circuit is shown in Figure 1. This second edition IEC 61000-3-3 cancels and replaces the first edition published in 1994, amendment 1 (2001) and amendment 2 (2005). This edition constitutes a revised edition. |
| 국제분류(ICS)코드 | 33.100.10 : 방사 |
| 페이지수 | 50 |
| Edition | 2.0 |
| No. | 표준번호 | 표준명 | 발행일 | 상태 |
|---|---|---|---|---|
| 1 | IEC 61000-3-3:2013/AMD2:2021/COR1:2022 | Corrigendum 1 - Amendment 2 - Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤16 A per phase and not subject to conditional connection | 2022-01-10 | 표준 |
| 2 | IEC 61000-3-3:2013/AMD2:2021 | Amendment 2 - Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤16 A per phase and not subject to conditional connection | 2021-03-25 | 표준 |
| 3 | IEC 61000-3-3:2013+AMD1:2017+AMD2:2021 CSV | Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤16 A per phase and not subject to conditional connection | 2021-03-25 | 표준 |
| 4 | IEC 61000-3-3:2013/AMD1:2017 | Amendment 1 - Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection | 2017-05-18 | 표준 |
| 5 | IEC 61000-3-3:2013+AMD1:2017 CSV | Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection | 2017-05-18 | 표준 |
| 6 | IEC 61000-3-3:2013 | Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤16 A per phase and not subject to conditional connection | 2013-05-14 | 표준 |
| 7 | IEC 61000-3-3:2013 RLV | Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection | 2013-05-14 | 표준 |
| 8 | IEC 61000-3-3:2008 | Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤16 A per phase and not subject to conditional connection | 2008-06-23 | 구판 |
| 9 | IEC 61000-3-3:2008 RLV | Electromagnetic compatibility (EMC) – Part 3-3: Limits – Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection | 2008-06-23 | 구판 |
| 10 | IEC 61000-3-3:1994+AMD1:2001+AMD2:2005 CSV | Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection | 2005-10-13 | 구판 |
| 11 | IEC 61000-3-3:1994/AMD2:2005 | Amendment 2 - Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection | 2005-08-30 | 구판 |
| 12 | IEC 61000-3-3:1994+AMD1:2001 CSV | Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <= 16 A per phase and not subject to conditional connection | 2002-03-12 | 구판 |
| 13 | IEC 61000-3-3:1994/AMD1:2001 | Amendment 1 - Electromagnetic compatibility (EMC) - Part 3: Limits - Section 3: Limitation of voltage fluctuations and flicker in low-voltage supply systems for equipment with rated current ≤ 16 A | 2001-01-30 | 구판 |
| 14 | IEC 61000-3-3:1994 | Electromagnetic compatibility (EMC) - Part 3: Limits - Section 3: Limitation of voltage fluctuations and flicker in low-voltage supply systems for equipment with rated current <= 16 A | 1994-12-01 | 구판 |
IEC TR 61000-2-1:1990 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 1: Description of the environment - Electromagnetic environment for low-frequency conducted disturbances and signalling in public power supply systems 상세보기
IEC TR 61000-2-3:1992 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 3: Description of the environment - Radiated and non-network-frequency-related conducted phenomena 상세보기
IEC 61000-4-12:1995 - Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 12: Oscillatory waves immunity test. Basic EMC Publication 상세보기
IEC TR 61000-2-6:1995 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 6: Assessment of the emission levels in the power supply of industrial plants as regards low-frequency conducted disturbances 상세보기
IEC 61000-5-5:1996 - Electromagnetic compatibility (EMC) - Part 5: Installation and mitigation guidelines - Section 5: Specification of protective devices for HEMP conducted disturbance. Basic EMC Publication 상세보기
IEC 61000-4-5:2005 - Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test 상세보기
IEC 61000-3-2:2005+AMD1:2008+AMD2:2009 CSV - Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current ≤16 A per phase) 상세보기
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CISPR 16-1-2:2014 - Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-2: Radio disturbance and immunity measuring apparatus - Coupling devices for conducted disturbance measurements 상세보기
CISPR 16-1-2:2014/AMD1:2017 - Amendment 1 - Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-2: Radio disturbance and immunity measuring apparatus - Coupling devices for conducted disturbance measurements 상세보기
IEC TS 63134:2020 - Active assisted living (AAL) use cases 상세보기
IEC 60034-5:2020 RLV - Rotating electrical machines - Part 5: Degrees of protection provided by the integral design of rotating electrical machines (IP code) - Classification 상세보기
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