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Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test (Adopted IEC 61000-4-4:2012, third edition, 2012-04) | Compatibilité électromagnétique (CEM) - Partie 4-4: Techniques d'essa
| 분야 | 11 : LG Electronics |
|---|---|
| 적용범위 | Preface This is the third edition of CAN/CSA-IEC 61000-4-4, Electromagnetic compatibility (EMC) ? Part 4-4: Testing and measurement techniques ? Electrical fast transient/burst immunity test, which is an adoption without modification of the identically titled IEC (International Electrotechnical Commission) Standard 61000-4-4 (third edition, 2012-04). It supersedes the previous edition published in 2006 as CAN/CSA-CEI/IEC 61000-4-4 (adopted IEC 61000-4-4:2004).? Scope This part of IEC 61000 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It gives immunity requirements and test procedures related to electrical fast transients/bursts. It additionally defines ranges of test levels and establishes test procedures.? The object of this standard is to establish a common and reproducible reference in order to evaluate the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon.? Note: As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard is applied or not, and if applied, they are responsible for determining the appropriate test levels and performance criteria.? The standard defines: ? test voltage waveform range of test levels test equipment? calibration and verification procedures of test equipment test setups test procedure The standard gives specifications for laboratory and in situ tests.? ---------------------------------------- Pr?face? Ce document constitue la troisi?me ?dition de la CAN/CSA-IEC 61000-4-4, Compatibilit? ?lectromagn?tique (CEM) ? Partie 4-4 : Techniques d’essai et de mesure ? Essai d’immunit? aux transitoires ?lectriques rapides en salves. II s’agit de l’adoption, sans modifications, de la norme IEC (Commission ?lectrotechnique Internationale) 61000-4-4 (troisi?me ?dition, 2012-04) qui porte le m?me titre. Cette norme remplace l’?dition ant?rieure publi?e en 2006 qui portait la d?signation CAN/CSA-CEI/IEC 61000-4-4 (norme IEC 61000-4-4:2004 adopt?e).? Domaine d'application La pr?sente partie de la CEI 61000 concerne l'immunit? des mat?riels ?lectriques et ?lectroniques aux transitoires rapides r?p?titifs. Elle donne les exigences d’immunit? et les proc?dures d’essai relatives aux transitoires ?lectriques rapides en salves. Elle d?finit en outre des gammes de niveaux d'essais et ?tablit des proc?dures d'essai.? L’objet de la pr?sente norme est d’?tablir une r?f?rence commune et reproductible dans le but d'?valuer l’immunit? des mat?riels ?lectriques et ?lectroniques quand ils sont soumis aux transitoires ?lectriques rapides en salves sur les acc?s d’alimentation, de signal, de commande et de terre. La m?thode d’essai document?e dans la pr?sente partie de la CEI 61000 d?crit une m?thode coh?rente dans le but d’?valuer l’immunit? d’un mat?riel ou syst?me vis-?-vis d’un ph?nom?ne d?fini.? Note: Comme d?crit dans le Guide 107 de la CEI, c’est une publication fondamentale en CEM pour l'utilisation par les Comit?s de produits de la CEI. Comme indiqu? ?galement dans le Guide 107, les Comit?s de produits de la CEI ont la responsabilit? de d?terminer s’ils appliquent ou non cette norme d’essai d’immunit? et, si c’est le cas, ils ont la responsabilit? de d?terminer les niveaux d’essai et les crit?res de performance appropri?s.? La norme d?finit: ? la forme d'onde de l'essai en tension? la gamme des niveaux d'essais le mat?riel d'essai? les proc?dures d'?talonnage et de v?rification du mat?riel d’essai? les montages d'essai? la proc?dure d'essai La norme donne des sp?cifications pour les essais men?s en laboratoire et les essais in situ. ? |
| 국제분류(ICS)코드 | |
| 페이지수 | 114 |
| Edition |
| No. | 표준번호 | 표준명 | 발행일 | 상태 |
|---|---|---|---|---|
| 1 | CSA IEC 61000-4-4:16 (R2021) | Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test (Adopted IEC 61000-4-4:2012, third edition, 2012-04) | Compatibilité électromagnétique (CEM) - Partie 4-4: Techniques d'essa | 2016-01-01 | 표준 |
| 2 | IEC 61000-4-4:2012 | Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test | 2012-04-30 | 표준 |
| 3 | IEC 61000-4-4:2012 RLV | Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test | 2012-04-30 | 표준 |
| 4 | IEC 61000-4-4:2004+AMD1:2010 CSV | Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test | 2011-03-30 | 구판 |
| 5 | IEC 61000-4-4:2004/AMD1:2010 | Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test | 2010-01-27 | 구판 |
| 6 | IEC 61000-4-4:2004/COR2:2007 | Corrigendum 2 - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test | 2007-06-06 | 구판 |
| 7 | IEC 61000-4-4:2004/COR1:2006 | Corrigendum 1 - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test | 2006-08-15 | 구판 |
| 8 | IEC 61000-4-4:2004 | Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test | 2004-07-08 | 구판 |
| 9 | IEC 61000-4-4:1995/AMD2:2001 | Amendment 2 - Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 4: Electrical fast transient/burst immunity test. Basic EMC Publication | 2001-07-11 | 구판 |
| 10 | IEC 61000-4-4:1995/AMD1:2000 | Amendment 1 - Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 4: Electrical fast transient/burst immunity test. Basic EMC Publication | 2000-11-09 | 구판 |
| 11 | IEC 61000-4-4:1995 | Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 4: Electrical fast transient/burst immunity test. Basic EMC Publication | 1995-01-18 | 구판 |
IEC TR 61000-2-1:1990 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 1: Description of the environment - Electromagnetic environment for low-frequency conducted disturbances and signalling in public power supply systems 상세보기
IEC TR 61000-2-3:1992 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 3: Description of the environment - Radiated and non-network-frequency-related conducted phenomena 상세보기
IEC 61000-4-12:1995 - Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 12: Oscillatory waves immunity test. Basic EMC Publication 상세보기
IEC TR 61000-2-6:1995 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 6: Assessment of the emission levels in the power supply of industrial plants as regards low-frequency conducted disturbances 상세보기
IEC 61000-5-5:1996 - Electromagnetic compatibility (EMC) - Part 5: Installation and mitigation guidelines - Section 5: Specification of protective devices for HEMP conducted disturbance. Basic EMC Publication 상세보기
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ASME NQA-1-2019 - Quality Assurance Requirements for Nuclear Facility Applications 상세보기
NFPA 70 2020 Edition, 2020 - National Electrical Code 상세보기
NEMA WC 57 2021 Edition, 2021 - Standard for Control, Thermocouple Extension, and Instrumentation Cables 상세보기
IEEE 14764-2021 - ISO/IEC/IEEE International Standard - Software engineering - Software life cycle processes - Maintenance 상세보기
IEC TS 63134:2020 - Active assisted living (AAL) use cases 상세보기
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